Dr Ian Ross
School of Chemical, Materials and Biological Engineering
Electron Microscopy Facility Manager
+44 114 222 5811
Full contact details
School of Chemical, Materials and Biological Engineering
North Campus
Broad Lane
91Ö±²¥
S3 7HQ
- Profile
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With a background in chemical and ceramic manufacturing, gaining Grad-I-Ceram in 1991, Ian received his MSc (Eng.) and PhD in Materials Science from the University of Liverpool in 1994 and 1998 respectively. His PhD, in collaboration with Unilever Research, focused on the application of high resolution electron microscopy to study the evolution of optically active nano-materials. Following his PhD, he moved to the University of Southampton, developing the use of microscopy and optical spectroscopy to characterise natural composites and fibres.
Ian joined the University of 91Ö±²¥ in 1999 as a Postdoctoral researcher within the Department of Materials Science and Engineering and from 2009 as a Senior Experimental Officer in the Department of Electronic and Electrical Engineering. In 2018 he returned to the Department of Materials Science and Engineering when appointed Facility Manager of the Sorby Centre for Electron Microscopy.
- Research interests
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The application of advanced electron microscopy, including aberration corrected TEM/STEM and associated analysis, to the study of:
- Complex interfaces, thin films and semiconductor materials.
- Engineering ceramics, oxide layers and metal-hybrid nano-structures.
- Durability of novel protective surface coatings.
- Natural bio-composites and fibres.
- Publications
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Journal articles
- . Journal of Applied Physics, 125(13), 135301-135301.
- . Applied Physics Letters, 113(1), 012105-012105.
- . Journal of Applied Physics, 123(21), 215303-215303.
- . Optica, 5(5), 528-528.
- . Journal of Electron Spectroscopy and Related Phenomena.
- . IEEE Journal of Selected Topics in Quantum Electronics, 23(6).
- . Nature Photonics, 10(5), 307-311.
- . Carbon, 97, 54-70.
- . Nanoscale Research Letters, 10(1).
- . Scientific Reports, 5(1).
- . Small, 10(1), 60-65.
- . The Journal of Physical Chemistry C, 117(46), 24561-24569.
- . ACS Nano, 7(9), 8214-8223.
- . Physics Procedia, 40, 49-55.
- . Physical Chemistry Chemical Physics, 15(12), 4291-4291.
- . Open Engineering, 3(4).
- . Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 307, 273-276.
- . Journal of Materials Science, 48, 2883-2892.
- . Acta-Biomaterialia, 9(4), 6226-6235.
- . Microscopy and Microanalysis, 18(S2), 382-383.
- . Proceedings of the IEEE Conference on Nanotechnology.
- . Physica Status Solidi (C) Current Topics in Solid State Physics, 9(3-4), 546-549.
- . ACS Nano, 6(1), 421-430.
- . Wear, 271(9-10), 2150-2156.
- . THIN SOLID FILMS, 518(18), 5121-5127.
- . WEAR, 267(5-8), 965-975.
- . CORROS SCI, 51(5), 1189-1196.
- . MATER HIGH TEMP, 26(2), 169-176.
- . WEAR, 263, 707-718.
- . J VAC SCI TECHNOL A, 25(5), 1402-1406.
- . J APPL PHYS, 102(2).
- . THIN SOLID FILMS, 515(17), 6791-6797.
- . PHYS REV B, 75(4).
- . CHEM MATER, 18(26), 6414-6424.
- . Journal of Crystal Growth, 297(1), 38-43.
- . MICROELECTRONICS JOURNAL, 37(12), 1505-1510.
- . J CRYST GROWTH, 289(1), 63-67.
- . THIN SOLID FILMS, 496(2), 306-310.
- . J CRYST GROWTH, 285(1-2), 17-23.
- . J MATER CHEM, 15(48), 5136-5143.
- . APPL PHYS LETT, 84(9), 1612-1612.
- . Microscopy and Microanalysis, 10(SUPPL. 2), 1196-1197.
- . J EUR CERAM SOC, 24(7), 2023-2029.
- . APPL PHYS LETT, 83(10), 1965-1967.
- The role of trace additions of alumina to yttria-tetragonal zirconia polycrystals (Y-TZP). SCRIPTA MATER, 45(6), 653-660.
Chapters
Conference proceedings papers
- Object orientated Monte-Carlo model incorporating quantum dot size anisotropy effects in state-of-the-art quantum dot lasers. Optics InfoBase Conference Papers, Vol. Part F125-JSAP 2018
- . Novel In-Plane Semiconductor Lasers XVII, 27 January 2018 - 1 February 2018.
- . Silicon Photonics XII
- Electrically pumped continuous-wave III-V quantum dot lasers monolithically grown on silicon. Conference Digest - IEEE International Semiconductor Laser Conference
- Production of regular quantum dot arrays by focused ion beams. 8th Int. Conf. Quantum Dots (pp 135-135). Pisa, 11 May 2014 - 16 May 2014.
- . Journal of Physics: Conference Series, Vol. 522(1)
- . Journal of Physics: Conference Series, Vol. 471 (pp 012047-1-012047-4). Bristol, 7 April 2013 - 11 April 2013.
- . Journal of Physics: Conference Series, Vol. 471 (pp 012039-1-012039-4). Bristol, 7 April 2013 - 11 April 2013.
- Quantum dot nucleation on focused ion beam patterned GaAs substrates. 15th European Microscopy Congress, Vol. 1(Physical Sciences: Applications) (pp 927-928). Oxford, 16 September 2012 - 21 September 2012.
- Study of controlled quantum dot formation on focused ion beam patterned GaAs substrates. IEEE-Nano2012, Vol. digital abstract booklet (pp 716-718). London, 20 August 2012 - 23 August 2012.
- . Journal of Physics: Conference Series, Vol. 371
- Characterization of thickness, elemental distribution and band-gap properties in AlGaN/GaN quantum wells by aberration-corrected TEM/STEM. Journal of Physics: Conference Series, Vol. 371 (pp 012014)
- Performance of a cold field-emission gun double aberration corrected TEM/STEM at 80kV. Journal of Physics: Conference Series, Vol. 371 (pp 012013)
- Configuring a 300kV cold field-emission gun for optimum analytical performance. Journal of Physics: Conference Series, Vol. 371 (pp 012012)
- Analysis of partially oxidised epitaxial silicon mono-layers on germanium virtual substrates using aberration corrected scanning transmission electron microscopy. Journal of Physics: Conference Series, Vol. 326(1) (pp 012050-1-012050-4). Bristol, 4 April 2011 - 7 April 2011.
- Comparison of the contrast in conventional and lattice resolved ADF STEM images of InGaAs/GaAs structures using different camera lengths. Journal of Physics: Conference Series, Vol. 326(1) (pp 012041-1-012041-4). Bristol, 4 April 2011 - 7 April 2011.
- A TEM study of Ge-on-(111)Si structures for potential use in high performance PMOS device technology. Journal of Physics: Conference Series, Vol. 326(1) (pp 012023-1-012023-4). Bristol, 4 April 2011 - 7 April 2011.
- . Journal of Physics: Conference Series, Vol. 241 (pp 012071-012071)
- . Journal of Physics: Conference Series, Vol. 241
- . ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009), Vol. 241
- . ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009), Vol. 241
- . Journal of Physics: Conference Series, Vol. 241
- . PLASMA PROCESSES AND POLYMERS, Vol. 6 (pp S118-S123)
- . EMC 2008, Vol. 2 (pp 711-712). Berlin Heidelberg, 1 September 2008 - 5 September 2008.
- Structural and Compositional Properties of Strain-Symmetrized SiGe/Si Heterostructures. MICROSCOPY OF SEMICONDUCTING MATERIALS 2007, Vol. 120 (pp 269-272)
- Oxidation performance of nano-scale multilayer coatings on gamma-TiAl - art. no. 012022. EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007, Vol. 126 (pp 12022-12022)
- Oxidation characteristics of gamma-TiAl-8Nb coated with a CrAlYN/CrN nanoscale multilayer coating. STRUCTURAL ALUMINIDES FOR ELEVATED TEMPERATURES: GAMMA TITANIUM AND OTHER: METALLIC ALUMINIDES (pp 315-322)
- . COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS, Vol. 284 (pp 379-383)
- Characterisation of tungsten nano-wires prepared by electron and ion beam induced chemical vapour deposition.. EMAG-NANO 2005: Imaging, Analysis and Fabrication on the Nanoscale, Vol. 26 (pp 363-366)
- . EMAG-NANO 2005: Imaging, Analysis and Fabrication on the Nanoscale, Vol. 26 (pp 215-218)
- . Quantum Dots, Particles, and Nanoclusters III, Vol. 6129 (pp G1290-G1290)
- Microstructural studies of InAs/GaAs self-assembled quantum dots grown by selective area molecular beam epitaxy. Microscopy of Semiconducting Materials, Vol. 107 (pp 267-270)
- Failure analysis studies in pseudomorphic SiGe channel p-MOSFET devices. Microscopy of Semiconducting Materials, Vol. 107 (pp 413-416)
- A study of processed and unprocessed dual channel Si/SiGe MOSFET device structures using FIB and TEM. Microscopy of Semiconducting Materials, Vol. 107 (pp 111-114)
- Structural analysis of the effects of a combined InAlAs-InGaAs capping layer in 1.3-mu m InAs quantum dots. Microscopy of Semiconducting Materials, Vol. 107 (pp 263-266)
- . Fourth International Conference on Physics of Light-Matter Coupling in Nanostructures (PLMCN4), Vol. 2(2) (pp 813-816)
- Segregation in compound semiconductors: the Stranski-Krastanow epitaxial transition and electron beam damage processes. 13th European Microscopy Congress (EMC 2004), Vol. 2 (Materials Sciences) (pp 417-418). Herentals, 22 August 2004 - 27 August 2004.
- Understanding interfacial bonding in alumina doped yttria-stabilised tetragonal zirconia using electron energy loss spectroscopy. ELECTRON MICROSCOPY AND ANALYSIS 2003(179) (pp 433-436)
- TEM analysis of dual column FIB processed Si/SiGe MOSFET device structures. ELECTRON MICROSCOPY AND ANALYSIS 2003(179) (pp 371-374)
- Nanostructural studies of biomineralised composites. ELECTRON MICROSCOPY AND ANALYSIS 2003(179) (pp 151-154)
- Nano-clustering anomalies in InGaN/GaN multiple quantum well structures. MICROSCOPY OF SEMICONDUCTING MATERIALS 2003(180) (pp 297-300)
- Processing and structural characterisation of 3Y-TZP ceramics resistant to hydrothermal ageing. EURO CERAMICS VII, PT 1-3, Vol. 206-2 (pp 1053-1056)
- Grain boundary segregation in Al2O3 doped 3Y-TZP ceramics. ELECTRON MICROSCOPY AND ANALYSIS 2001(168) (pp 299-302)
- Differentiation of zirconia polymorphs using EELS and ELNES. ELECTRON MICROSCOPY AND ANALYSIS 2001(168) (pp 303-306)
- HREM studies of an electron beam induced morphological rearrangement in acicular ZnO. ELECTRON MICROSCOPY AND ANALYSIS 1999(161) (pp 299-302)
- Controlling the microstructure of ZnO powders produced via a sol-gel process. Eleventh European Conference on Electron Microscopy EUREM-11, Vol. II (pp 798-799). Brussels, 26 August 1996 - 30 August 1996.
- Characterisation of iron doped zinc oxide using TEM. Electron Microscopy and Analysis 1995, Vol. 147(Inst. Phys. Conf. Series.) (pp 95-98). Bristol, 12 September 1995 - 15 September 1995.
- Thermal stability of metal nitride multilayer coatings: investigations using EELS and aberration corrected STEM. emc2012 Proceedings of the 15th European Microscopy Congress, Vol. 1 (pp 377-378). Manchester, UK, 16 September 2012 - 21 September 2012.
- E-beam induced surface activity changes of cerium oxide nanocrystals observed with in-situ aberration corrected TEM imaging at TV rate. emc2012 Proceedings of the 15th European Microscopy Congress, Vol. 1 (pp 939-940). Manchester, UK, 16 September 2012 - 21 September 2012.
- Co and Pt implantation through nanoporous masks observed by aberration corrected STEM and spectrum imaging. emc2012 Proceedings of the 15th European Microscopy Congress, Vol. 1 (pp 959-960). Manchester, UK, 16 September 2012 - 21 September 2012.