@article{article, title  = {{Scanning transmission electron microscopy measurement of bismuth segregation in thin Ga(As,Bi) layers grown by molecular beam epitaxy}},

 publisher = {{Wiley}},

 url = {{http://eprints.whiterose.ac.uk/91479/ }},

 year = {{2014}},

 month = {{7}},

 author = {{Walther T and Richards RD and Bastiman F}},

 doi = {{10.1002/crat.201400157}},

 volume = {{50}},

 journal = {{Crystal Research and Technology}},

 issue = {{1}},

 pages = {{38-42}},

 note = {{Accessed on 2024/10/22}}}