TY  - JOUR

T1  - Correlation between defect density and current leakage in InAs/GaAs quantum dot-in-well structures

JO  - J APPL PHYS

PY  - 2009/07/15

AU  - Sanchez AM

AU  - Beanland R

AU  - Hasbullah NF

AU  - Hopkinson M

AU  - David JPR

ED  - 

DO  - DOI: 10.1063/1.3168492

VL  - 106

IS  - 2

Y2  - 2024/12/25

ER  -