TY  - CONF

T1  - EELS and STEM analysis of metal nitride/substrate interfaces

JO  - ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009)

PY  - 2010/01/01

AU  - Ross IM

AU  - Zhou Z

AU  - Rainforth WM

AU  - Bleloch A

AU  - Ehiasarian AP

AU  - Hovespian PE

ED  - Baker RT

DO  - DOI: 10.1088/1742-6596/241/1/012102

VL  - 241

Y2  - 2024/10/24

ER  -