TY  - JOUR

T1  - Impact ionization coefficients in Al<inf>0.52</inf>In<inf>0.48</inf>P

JO  - IEEE Electron Device Letters

PY  - 2011/01/01

AU  - Ong JSL

AU  - Ng JS

AU  - Krysa AB

AU  - David JPR

ED  - 

DO  - DOI: 10.1109/LED.2011.2165520

VL  - 32

IS  - 11

SP  - 1528

EP  - 1530

Y2  - 2024/12/25

ER  -