TY  - CONF

T1  - Characterization of InGaAs (N)/GaAsN multi-quantum wells using transmission electron microscopy

JO  - MICROSCOPY OF SEMICONDUCTING MATERIALS 2003

PY  - 2018/01/01

AU  - Gutierrez M

AU  - Herrera M

AU  - Ross I

AU  - Gonzalez D

AU  - Hopkinson M

AU  - Garcia R

ED  - Cullis AG

ED  - Midgley PA

IS  - 180

SP  - 143

EP  - 146

Y2  - 2024/12/25

ER  -