TY  - JOUR

T1  - Analysis of P<inf>b</inf> centers in ultrathin hafnium silicate gate stacks

JO  - IEEE Transactions on Electron Devices

PY  - 2007/09/01

AU  - Sicre SBF

AU  - De Souza MM

ED  - 

DO  - DOI: 10.1109/TED.2007.902238

VL  - 54

IS  - 9

SP  - 2551

EP  - 2555

Y2  - 2024/12/26

ER  -