TY  - CONF

T1  - Crack formation in tensile strained III-V epilayers grown on InP substrates

JO  - MICROSCOPY OF SEMICONDUCTING MATERIALS 1995

PY  - 1995/01/01

AU  - Murray RT

AU  - Kiely CJ

AU  - Hopkinson M

AU  - Goodhew PJ

ED  - Cullis AG

ED  - StatonBevan AE

VL  - 146

SP  - 207

EP  - 210

Y2  - 2024/12/25

ER  -