@article{article, title  = {{Helium ion microscopy and energy selective scanning electron microscopy-two advanced microscopy techniques with complementary applications}},

 url = {{}},

 year = {{2014}},

 month = {{1}},

 author = {{Rodenburg C and Jepson MAE and Boden SA and Bagnall DM}},

 doi = {{10.1088/1742-6596/522/1/012049}},

 volume = {{522}},

 journal = {{Journal of Physics: Conference Series}},

 issue = {{1}},

 note = {{Accessed on 2024/12/26}}}