TY  - CONF

T1  - Scattering at MOS Interfaces

JO  - WORLD CONGRESS ON ENGINEERING 2009, VOLS I AND II

PY  - 2009/01/01

AU  - Shah R

AU  - De Souza MM

ED  - 

SN  - 978-988-17012-5-1

SP  - 392

EP  - +

Y2  - 2024/12/26

ER  -