TY  - JOUR

T1  - Avalanche noise characteristics in submicron InP diodes

JO  - IEEE J QUANTUM ELECT

PY  - 2008/03/01

AU  - Tan LJJ

AU  - Ng JS

AU  - Tan CH

AU  - David JPR

ED  - 

DO  - DOI: 10.1109/JQE.2007.914771

VL  - 44

IS  - 3-4

SP  - 378

EP  - 382

Y2  - 2024/12/26

ER  -