TY  - CONF

T1  - Hot-carrier injection in step-drift rf power LDMOSFET

JO  - IEEE International Reliability Physics Symposium Proceedings

PY  - 2004/01/01

AU  - Cao G

AU  - De Souza MM

ED  - 

DO  - DOI: 10.1109/RELPHY.2004.1315338

VL  - 2004-January

IS  - January

SP  - 283

EP  - 287

Y2  - 2025/01/13

ER  -