@article{article, title  = {{Characterisation of series resistance degradation through charge pumping technique}},

 url = {{}},

 year = {{2003}},

 month = {{4}},

 author = {{Manhas SK and Sehkar DC and Oates AS and De Souza MM}},

 doi = {{10.1016/S0026-2714(03)00017-9}},

 volume = {{43}},

 journal = {{MICROELECTRONICS RELIABILITY}},

 issue = {{4}},

 pages = {{617-624}},

 note = {{Accessed on 2025/01/13}}}