TY  - CONF

T1  - Experimental analysis of dynamic charge acceptance test conditions for lead-acid cells

JO  - IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society

UR  - http://eprints.whiterose.ac.uk/113905/

PY  - 2016/12/21

AU  - Smith MJ

AU  - Gladwin DT

AU  - Stone DA

ED  - 

DO  - DOI: 10.1109/iecon.2016.7793307

PB  - IEEE

Y2  - 2024/12/26

ER  -