TY  - CONF

T1  - Early stage hot carrier degradation of state-of-the-art LDD N-MOSFETs

JO  - Annual Proceedings - Reliability Physics (Symposium)

PY  - 2000/01/01

AU  - Manhas SK

AU  - De Souza MM

AU  - Oates AS

AU  - Chetlur SC

AU  - Narayanan EM

ED  - 

DO  - DOI: 10.1109/RELPHY.2000.843899

SP  - 108

EP  - 111

Y2  - 2024/12/26

ER  -