@inproceedings{inproceedings, title  = {{Early stage hot carrier degradation of state-of-the-art LDD N-MOSFETs}},

 url = {{}},

 year = {{2000}},

 month = {{1}},

 author = {{Manhas SK and De Souza MM and Oates AS and Chetlur SC and Narayanan EM}},

 doi = {{10.1109/RELPHY.2000.843899}},

 journal = {{Annual Proceedings - Reliability Physics (Symposium)}},

 pages = {{108-111}},

 note = {{Accessed on 2025/01/13}}}