TY  - JOUR

T1  - Analytical prediction of the short-circuit current in fault-tolerant permanent-magnet machines

JO  - IEEE Transactions on Industrial Electronics

PY  - 2008/12/01

AU  - Sun Z

AU  - Wang J

AU  - Howe D

AU  - Jewell G

ED  - 

DO  - DOI: 10.1109/TIE.2008.2005019

VL  - 55

IS  - 12

SP  - 4210

EP  - 4217

Y2  - 2024/12/25

ER  -