TY  - JOUR

T1  - The Kirk effect in the DELDI technology

JO  - MICROELECTRONICS JOURNAL

PY  - 2000/03/01

AU  - Qin Z

AU  - Narayanan EMS

AU  - De Souza MM

ED  - 

DO  - DOI: 10.1016/S0026-2692(99)00119-6

VL  - 31

IS  - 3

SP  - 175

EP  - 185

Y2  - 2025/04/27

ER  -