TY  - CONF

T1  - Use of raw capacitance tomography data for flow pattern control

JO  - 2nd World Congress on Industrial Process Tomography

PY  - 2014/01/01

AU  - Jeanmeure LFC

AU  - Dyakowski T

AU  - Zimmerman WBJ

AU  - Baker G

ED  - 

SN  - 9780853163183

SP  - 12

EP  - 19

Y2  - 2024/12/26

ER  -