TY  - JOUR

T1  - Effect level based parameterization method for diffuse scattering models at millimeter-wave frequencies

JO  - IEEE Access

UR  - http://eprints.whiterose.ac.uk/153311/

PY  - 2019/07/10

AU  - Tian H

AU  - Liao X

AU  - Wang Y

AU  - Shao Y

AU  - Zhou J

AU  - Hu T

AU  - Zhang J

ED  - 

DO  - DOI: 10.1109/access.2019.2927612

PB  - Institute of Electrical and Electronics Engineers (IEEE)

VL  - 7

SP  - 93286

EP  - 93293

Y2  - 2024/10/22

ER  -