TY  - CONF

T1  - TEM characterisation of nanoindentation deformation in Cu-Ti thin films sectioned by FIB

PY  - 2002/01/01

AU  - Mobus G

AU  - Inkson BJ

AU  - Bobji MS

AU  - Kraft O

AU  - Wagner T

ED  - 

VL  - 1

SP  - 1021

Y2  - 2024/12/26

ER  -