@article{article, title  = {{A Comparison of Early Stage Hot carrier Degradation behaviour in 5V & 3 V submicron Low Doped Drain Metal Oxide Semiconductor Field Effect Transistors}},

 url = {{}},

 year = {{2001}},

 month = {{1}},

 author = {{De Souza MM and Wang J and Manhas S and Oates AS and Sankara Narayanan EM}},

 volume = {{42}},

 journal = {{Microelectronics reliability}},

 issue = {{2}},

 pages = {{169}},

 note = {{Accessed on 2024/12/26}}}