TY  - CONF

T1  - Opportunities and pitfalls in characterisation of nanoscale features

JO  - MATERIALS SCIENCE AND TECHNOLOGY

PY  - 2000/11/01

AU  - Rainforth WM

ED  - 

VL  - 16

IS  - 11-12

SP  - 1349

EP  - 1355

Y2  - 2024/10/24

ER  -