TY  - CONF

T1  - Determination of impact ionization coefficients measured from 4H-silicon carbide avalanche photodiodes

JO  - Silicon Carbide and Related Materials 2006

PY  - 2007/01/01

AU  - Loh WS

AU  - Johnson CM

AU  - Ng JS

AU  - Sandvik PM

AU  - Arthur SD

AU  - Soloviev SI

AU  - David JPR

ED  - Wright N

ED  - Johnson CM

ED  - Vassilevski K

ED  - Nikitina I

ED  - Horsfall A

VL  - 556-557

SP  - 339

EP  - 342

Y2  - 2024/12/25

ER  -