TY - JOUR T1 - Avalanche Breakdown Timing Statistics for Silicon Single Photon Avalanche Diodes JO - IEEE Journal of Selected Topics in Quantum Electronics UR - http://eprints.whiterose.ac.uk/125653/ PY - 2017/12/04 AU - Petticrew JD AU - Dimler SJ AU - Zhou X AU - Morrison AP AU - Tan CH AU - Ng JS ED - DO - DOI: 10.1109/JSTQE.2017.2779834 VL - 24 IS - 2 Y2 - 2025/04/09 ER -