TY  - CONF

T1  - A comparison of avalanche breakdown probabilities in semiconductor materials

JO  - JOURNAL OF MODERN OPTICS

PY  - 2004/06/01

AU  - Ng JS

AU  - Tan CH

AU  - David JPR

ED  - 

DO  - DOI: 10.1080/09500340410001670848

VL  - 51

IS  - 9-10

SP  - 1315

EP  - 1321

Y2  - 2024/12/25

ER  -