TY  - CONF

T1  - Investigation of modeling methodologies for characterization of microstructure and their subsequent use for process design

PY  - 2003/01/01

AU  - Mahfouf M

AU  - Suarez-Gutierrez JI

AU  - Howe AA

AU  - Beynon JH

ED  - 

Y2  - 2024/12/25

ER  -