TY  - JOUR

T1  - Inspection of Enamel Removal Using Infrared Thermal Imaging and Machine Learning Techniques

JO  - Sensors

UR  - http://dx.doi.org/10.3390/s23083977

PY  - 2023/04/14

AU  - Tiwari D

AU  - Miller D

AU  - Farnsworth M

AU  - Lambourne A

AU  - Jewell GW

AU  - Tiwari A

ED  - 

DO  - DOI: 10.3390/s23083977

PB  - MDPI AG

VL  - 23

IS  - 8

SP  - 3977

EP  - 3977

Y2  - 2024/10/23

ER  -