TY  - CONF

T1  - Impact of oxide degradation on universal mobility behaviour of n-MOS inversion layers

JO  - PROCEEDINGS OF THE 9TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS

PY  - 2002/01/01

AU  - Manhas SK

AU  - De Souza MM

AU  - Oates AS

AU  - Chen Y

ED  - 

DO  - DOI: 10.1109/IPFA.2002.1025668

SP  - 227

EP  - 231

Y2  - 2024/12/26

ER  -