@inproceedings{inproceedings, title  = {{Impact of oxide degradation on universal mobility behaviour of n-MOS inversion layers}},

 url = {{}},

 year = {{2002}},

 month = {{1}},

 author = {{Manhas SK and De Souza MM and Oates AS and Chen Y}},

 doi = {{10.1109/IPFA.2002.1025668}},

 journal = {{PROCEEDINGS OF THE 9TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL & FAILURE ANALYSIS OF INTEGRATED CIRCUITS}},

 pages = {{227-231}},

 note = {{Accessed on 2024/12/26}}}