TY  - JOUR

T1  - Using Multiple-Feature-Spaces-Based Deep Learning for Tool Condition Monitoring in Ultraprecision Manufacturing

JO  - IEEE Transactions on Industrial Electronics

UR  - http://eprints.whiterose.ac.uk/133032/

PY  - 2019/05/01

AU  - Shi C

AU  - Panoutsos G

AU  - Luo B

AU  - Liu H

AU  - Li B

AU  - Lin X

ED  - 

DO  - DOI: 10.1109/TIE.2018.2856193

VL  - 66

IS  - 5

SP  - 3794

EP  - 3803

Y2  - 2024/12/25

ER  -