@article{article, title  = {{Impact ionization coefficients in 4H-SiC by ultralow excess noise measurement}},

 url = {{}},

 year = {{2012}},

 month = {{4}},

 author = {{Green JE and Loh WS and Marshall ARJ and Ng BK and Tozer RC and David JPR and Soloviev SI and Sandvik PM}},

 doi = {{10.1109/TED.2012.2185499}},

 volume = {{59}},

 journal = {{IEEE Transactions on Electron Devices}},

 issue = {{4}},

 pages = {{1030-1036}},

 note = {{Accessed on 2024/12/26}}}