TY  - JOUR

T1  - Quantitative diffractometry at 0.1 nm resolution for testing lenses and recording media of a high-voltage atomic resolution microscope

JO  - J ELECTRON MICROSC

PY  - 1997/01/01

AU  - Mobus G

AU  - Phillipp F

AU  - Gemming T

AU  - Schweinfest R

AU  - Ruhle M

ED  - 

VL  - 46

IS  - 5

SP  - 381

EP  - 395

Y2  - 2024/12/26

ER  -