TY  - JOUR

T1  - Carrier escape mechanisms from GaAs/Al<inf>x</inf>Ga<inf>1-x</inf>As multiple quantum wells in an electric field

JO  - Applied Physics Letters

PY  - 1993/01/01

AU  - Fox AM

AU  - Ispasoiu RG

AU  - Foxon CT

AU  - Cunningham JE

AU  - Jan WY

ED  - 

DO  - DOI: 10.1063/1.110272

VL  - 63

IS  - 21

SP  - 2917

EP  - 2919

Y2  - 2024/12/26

ER  -