TY  - CONF

T1  - Profiles of cracks formed in tensile epilayers of III-V compound semi-conductors

JO  - ELECTRON MICROSCOPY AND ANALYSIS 1997

PY  - 1997/01/01

AU  - Murray RT

AU  - Hopkinson M

AU  - Kiely CJ

ED  - Rodenburg JM

IS  - 153

SP  - 425

EP  - 428

Y2  - 2024/12/25

ER  -