TY - CONF T1 - Crack interactions in tensile-strained epilayers JO - MICROSCOPY OF SEMICONDUCTING MATERIALS 1997 PY - 1997/01/01 AU - Murray RT AU - Kiely CJ AU - Hopkinson M ED - Cullis AG ED - Hutchison JL IS - 157 SP - 169 EP - 172 Y2 - 2024/12/25 ER -