TY  - CONF

T1  - Electric field effects on the carrier migration in self-assembled InAs/GaAs quantum dots

JO  - MICROELECTRONICS JOURNAL

PY  - 2009/04/01

AU  - Marques FAM

AU  - Monte AFG

AU  - Hopkinson M

ED  - 

DO  - DOI: 10.1016/j.mejo.2008.11.025

VL  - 40

IS  - 4-5

SP  - 838

EP  - 840

Y2  - 2024/12/25

ER  -