@article{article, title  = {{Quantifying the nature of hot carrier degradation in the Spacer Region of LDD n MOSFETs}},

 url = {{}},

 year = {{2001}},

 month = {{1}},

 author = {{Manhas SK and De Souza MM and Oates AS}},

 volume = {{1}},

 journal = {{IEEE Transactions on Devices and Materials Reliability}},

 pages = {{134}},

 note = {{Accessed on 2025/01/13}}}